Use of Fourier transfoim in grazing X-rays reflectometry
نویسندگان
چکیده
Grazing X-ray reflectometry allows the analysis of thin layer stacks. The fitting of the reflectivity curve by a trial and error method can be used in order to determine the parameters of the films. Fourier analysis of the experimental reflectivity can directly give a rough determination of the profit index. Application to real examples shows the validity of the method.
منابع مشابه
Curvature effect in grazing X-ray reflectometry
Grazing X-ray reflectometry is currently used for the characterization of thin layer
متن کاملFourier-inversion and wavelet-transform methods applied to X-ray reflectometry and HRXRD profiles from complex thin-layered heterostructures
We show that X-ray scattering techniques can be used for the assessment of individual layer thicknesses inside complicated semi-conductor heterostructures dedicated to the opto-electronic domain. To this end, we propose methods to overcome two main drawbacks coming from: (1) the complexity of the X-ray profiles and, hence the difficulty to use model-dependent tools such as fitting procedures an...
متن کاملSynthesis and characterization of Ag doped Cobalt Ferrite nanocomposite
Nanomaterials are attracted a great deal of attention from scientific community due to its unique properties and applications. The small size ferrites have opened the door for intensive research to utilize their properties for biomedical applications. Cobalt ferrite nanomaterials and its silver doped (Ag-doped) nanocomposites have been prepared using solid state combustion method. This combusti...
متن کاملNS-ZnS:Mn, ZnS:Mn/Si3N4 multilayers with thicknesses of 1.9– 3.5 nm for ZnS were prepared by a rf-magnetron sputtering method. From the results of grazing incidence X-ray reflectometry and X-ray diffractmetry, formation of ZnS:Mn nanocrystals in the ZnS
We have developed a new type of a thin-film electroluminescence (TFEL) device with nanostructured (NS)-ZnS:Mn utilizing its enhanced luminescent efficiency due to the quantum confinement (QC) effects. As NS-ZnS:Mn, ZnS:Mn/Si3N4 multilayers with thicknesses of 1.9– 3.5 nm for ZnS were prepared by a rf-magnetron sputtering method. From the results of grazing incidence X-ray reflectometry and X-ra...
متن کامل2.B X-Ray Imaging with Kirkpatrick-Baez Microscopes
This article describes the design, testing, and use of Kirkpatrick-Baez (KB) x-ray microscopes on OMEGA. These microscopes consist of grazingincidence mirror pairs arranged to reflect and focus x rays, thereby providing images of the x-ray-emitting region. KB microscopes are one of several practical devices that can be used to focus and collect x rays. Simpler x-ray-imaging devices are the pinh...
متن کامل